IEC 62528:2007
Standard testability method for embedded core-based integrated circuits

Standard No.

IEC 62528:2007

Release Date

2007

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 62528:2007

Replace

IEC 93/250/FDIS:2007

Scope

IEEE Std 1500 has developed a standard design-for-testability method for integrated circuits (ICs) containing embedded nonmergeable cores. This method is independent of the underlying functionality of the IC or its individual embedded cores. The method creates the necessary requirements for the test of such ICs, while allowing for ease of interoperability of cores that may have originated from different sources.

IEC 62528:2007 Referenced Document

• IEEE Std 1149.1 IEEE Standard for Test Access Port and Boundary-Scan Architecture - Redline*， 2013-05-13 Update

IEC 62528:2007 history

• 2007 IEC 62528:2007 Standard testability method for embedded core-based integrated circuits