DIN 51088:2007
Testing of ceramic raw and basic materials - Determination of mass fractions of metallic trace impurities in silicon carbide powders and granular silicon carbides by optical emission spectrometry and excitation in the DC arc

Standard No.
DIN 51088:2007
Release Date
2007
Published By
German Institute for Standardization
Status
Replace By
DIN EN 15979:2011
Latest
DIN EN 15979:2011
Scope
This draft standard specifies a method for the determination of metallic trace impurities in silicon carbide powders and granular silicon carbides of ceramic raw and basic materials by optical emission spectrometry and excitation in the DC arc. The method is applicable to impurities, subject to the main parameters element, wave length, arc parameters and weighted sample, with mass fractions of about 1 mg/kg to about 3000 mg/kg, after checking also to about 5000 mg/kg.#,,#

DIN 51088:2007 history

  • 2011 DIN EN 15979:2011 Testing of ceramic raw and basic materials - Direct determination of mass fractions of impurities in powders and granules of silicon carbide by OES by DC arc excitation; German version EN 15979:2011
  • 2007 DIN 51088:2007 Testing of ceramic raw and basic materials - Determination of mass fractions of metallic trace impurities in silicon carbide powders and granular silicon carbides by optical emission spectrometry and excitation in the DC arc
Testing of ceramic raw and basic materials - Determination of mass fractions of metallic trace impurities in silicon carbide powders and granular silicon carbides by optical emission spectrometry and excitation in the DC arc



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