YD/T 1690.6-2007
Interior of Telecommunication Equipment-Measurement of Electromagnetic Emissions-150KHz to 1GHz Part 6:Measurement of Conducted Emissions-Magnetic Probe Method (English Version)
- Standard No.
- YD/T 1690.6-2007
- Language
- Chinese, Available in English version
- Release Date
- 2007
- Published By
- Professional Standard - Post and Telecommunication
- Latest
- YD/T 1690.6-2007
- Scope
- This section specifies a method for measuring radio frequency current at the pins of an integrated circuit (IC) using a micro magnetic field probe in a non-contact current measurement manner. This method can measure the radio frequency current generated by an IC in the frequency range of 150 kHz to 1 GHz. This section is applicable to the measurement of a single IC or to an IC on a standard test board: Description and comparison of chipsets
YD/T 1690.6-2007 Referenced Document
- GB/T 4365-2003 Electrotechnical terminology Electromagnetic compatibility
- YD/T 1690.1-2007 Interior of Telecommunication Equipment-Measurement of Electromagnetic Emissions-150KHz to 1GHz Part 1:General Conditions and Definitions
- YD/T 1690.4-2007 Interior of Telecommunication Equipment-Measurement of Electromagnetic Emissions-150KHz to 1GHz Part 4:Measurement of Conducted Emissions-1Ω/150Ω Direct Couplin Method
YD/T 1690.6-2007 history
- 2007 YD/T 1690.6-2007 Interior of Telecommunication Equipment-Measurement of Electromagnetic Emissions-150KHz to 1GHz Part 6:Measurement of Conducted Emissions-Magnetic Probe Method
