JEDEC JEP179-2006
Stress-Test-Driven Qualification of and Failure Mechanisms Associated with Assembled Solid State Surface- Mount Components
- Standard No.
- JEDEC JEP179-2006
- Release Date
- 2006
- Published By
- (U.S.) Joint Electron Device Engineering Council Soild State Technology Association
- Latest
- JEDEC JEP179-2006
- Scope
- The JEDEC standard DDR2 SDRAM must satisfy the requirement of 85C tCASE(max) operation at all times (Byte 47, bits 4:7 = 0000). There is an optional, higher tCASE operation allowed, up to 95C (Byte 47, bits 4:7 = 1010). If the optional higher tCASE limit is supported, there are two options that may or may not be supported to enhance the higher tCASE limit. These two options are vendor determined: (1) Double refresh required, (2) High Temp SR supported. If the base DRAM, i.e. tCASE(max) of 85C is specified, the two optional features are not required (but must be set to a default zero value.)
JEDEC JEP179-2006 history
- 2006 JEDEC JEP179-2006 Stress-Test-Driven Qualification of and Failure Mechanisms Associated with Assembled Solid State Surface- Mount Components
