JEDEC JEP118-1993
Guidelines for GaAs MMIC and FET Life Testing
- Standard No.
- JEDEC JEP118-1993
- Release Date
- 1993
- Published By
- (U.S.) Joint Electron Device Engineering Council Soild State Technology Association
- Latest
- JEDEC JEP118-1993
- Scope
- Life tests are run for various purposes. Tests run to detect the level of infant mortality involve short time durations; unless the percentage of devi& having infant mortality is extremely high, the sample size specified in this document is not nearly sufficient. Tests to determine device lifetime for a specific application may be conducted by or for a customer, here the stress and test conditions may be specific to the application. Other life tests are run by a manufacturer and are concerned with determining the lifetime of devices under typical or extreme operation.
JEDEC JEP118-1993 history
- 1993 JEDEC JEP118-1993 Guidelines for GaAs MMIC and FET Life Testing
