DIN V VDE V 0126-18-4-2:2007 Solar wafers - Part 4-2: Process for measuring the electrical characteristics of silicon - Minority carrier lifetime, Laboratory measuring method
2009DIN EN 50513:2009 Solar wafers - Data sheet and product information for crystalline silicon wafers for solar cell manufacturing; German version EN 50513:2009
2007DIN V VDE V 0126-18-4-2:2007 Solar wafers - Part 4-2: Process for measuring the electrical characteristics of silicon - Minority carrier lifetime, Laboratory measuring method