IEC 62374:2007
Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Standard No.

IEC 62374:2007

Release Date

2007

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 62374:2007

Replace

IEC 47/1894/FDIS:2006

Scope

This International Standard provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure.

IEC 62374:2007 history

• 2007 IEC 62374:2007 Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films