NF C96-022-27*NF EN 60749-27:2006
Semiconductor devices - Mechanical and climatic test methods - Part 27 : electrostatic discharge (ESD) sensivity testing - Machine model (MM).

Standard No.

NF C96-022-27*NF EN 60749-27:2006

Release Date

2006

Published By

Association Francaise de Normalisation

Latest

NF C96-022-27*NF EN 60749-27:2006

NF C96-022-27*NF EN 60749-27:2006 history

• 2006 NF C96-022-27*NF EN 60749-27:2006 Semiconductor devices - Mechanical and climatic test methods - Part 27 : electrostatic discharge (ESD) sensivity testing - Machine model (MM).