SJ/Z 11352-2006
Integrated circuit IP core test data interchange formats and guidelines specification (English Version)
- Standard No.
- SJ/Z 11352-2006
- Language
- Chinese, Available in English version
- Release Date
- 2006
- Published By
- Professional Standard - Electron
- Latest
- SJ/Z 11352-2006
- Scope
- This specification formulates test data exchange format and Design-for-Test (DFT, Design-for-Test) guidelines for providers of integrated circuit IP cores (hereinafter referred to as IP). The purpose of this specification is to define the format and nature of information transferred between IP providers and IP integrators. In addition, this specification also establishes some guidelines for IP providers to ensure that IP can be used in the design of system chips. The applicable scope of the data format covers the description of the creation, definition, exchange and integration of IP in integrated circuits.
SJ/Z 11352-2006 history
- 2006 SJ/Z 11352-2006 Integrated circuit IP core test data interchange formats and guidelines specification
