DIN EN 62373:2007
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006); German version EN 62373:2006

Standard No.

DIN EN 62373:2007

Release Date

2007

Published By

German Institute for Standardization

Latest

DIN EN 62373:2007

Replace

DIN IEC 62373:2004

Scope

This International Standard provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET).#,,#

DIN EN 62373:2007 history

• 2007 DIN EN 62373:2007 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006); German version EN 62373:2006
• 0000 DIN IEC 62373:2004