Recommended methods and standardized reporting practices for electrical characterization of printed and organic ring oscillators are covered. Describes the most common sources of measurement errors, particularly for high-impedance electrical measurements commonly required for printed and organic ring oscillators. Also gives recommended practices in order to minimize and/or characterize the effect of measurement artifacts and other sources of error encountered while measuring printed and organic ring oscillators.
ANSI/IEEE 1620.1:2006 history
2006ANSI/IEEE 1620.1:2006 Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators