BS EN 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Standard No.

BS EN 62373:2006

Release Date

2006

Published By

British Standards Institution (BSI)

Latest

BS EN 62373:2006

Replace

04/30113801 DC-2004

Scope

This International Standard provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET).

BS EN 62373:2006 history

• 2006 BS EN 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)