SJ 20233-1993
Verification regulation of model IMPACT-II semiconductor discrete device test sysytem (English Version)
- Standard No.
- SJ 20233-1993
- Language
- Chinese, Available in English version
- Published By
- Professional Standard - Electron
- Status
- Latest
- SJ 20233-1993
- Scope
- This calibration procedure stipulates the calibration conditions, calibration items, calibration methods, calibration result processing and calibration cycle of the IMPACT-II type semiconductor discrete device testing system. This calibration procedure is applicable to the calibration of IMPACT-II type semiconductor discrete device testing system. For the verification of IMPACT-III type semiconductor discrete device testing system. You can also refer to this procedure.
SJ 20233-1993 history
- 1970 SJ 20233-1993 Verification regulation of model IMPACT-II semiconductor discrete device test sysytem
