SJ 20231-1993
Verification regulation of KDK double gate FET Yfs tester (English Version)
- Standard No.
- SJ 20231-1993
- Language
- Chinese, Available in English version
- Published By
- Professional Standard - Electron
- Status
- Latest
- SJ 20231-1993
- Scope
- This calibration procedure stipulates the calibration conditions, calibration items, calibration methods, calibration result processing and calibration cycle of Guoyang double-gate field effect transistor Yfs tester. This calibration procedure is applicable to the calibration of Guoyang double-gate field effect transistor Yfs tester.
SJ 20231-1993 history
- 1970 SJ 20231-1993 Verification regulation of KDK double gate FET Yfs tester
