SAE J1752-1-1997
Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions

Standard No.

SAE J1752-1-1997

Release Date

1997

Published By

Society of Automotive Engineers (SAE)

Status

Be replaced

Replace By

SAE J1752-1-2006

Latest

SAE J1752-1-2021

Scope

This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in SAE J1752.

SAE J1752-1-1997 history

• 2021 SAE J1752-1-2021 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition
• 2016 SAE J1752-1-2016 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition
• 2006 SAE J1752-1-2006 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits Integrated Circuit EMC Measurement Procedures General and Definition
• 1997 SAE J1752-1-1997 Electromagnetic Compatibility Measurement Procedures for Integrated Circuits - Integrated Circuit EMC Measurement Procedures - General and Definitions