IEC 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

Standard No.

IEC 62373:2006

Release Date

2006

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 62373:2006

Replace

IEC 47/1862/FDIS:2006

Scope

This International Standard provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET).

IEC 62373:2006 history

• 2006 IEC 62373:2006 Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)