IEC 61967-4:2006
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions; 1 /150 direct coupling method
- Standard No.
- IEC 61967-4:2006
- Release Date
- 2006
- Published By
- International Electrotechnical Commission (IEC)
- Status
- Replace By
- IEC 61967-4:2002/AMD1:2006
- Latest
- IEC 61967-4:2021 RLV
- Scope
- This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods guarantee a high degree of repeatability and correlation of EME measurements. IEC 61967-1 specifies general conditions and definitions of the test methods.
IEC 61967-4:2006 history
- 0000 IEC 61967-4:2021 RLV
- 2017 IEC 61967-4:2002/COR1:2017 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions; 1 Ώ/150 Ώ direct coupling method - Corrigendum 1
- 2006 IEC 61967-4:2002/AMD1:2006 Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1
/150 direct coupling method - 2006 IEC 61967-4:2006 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions; 1
/150 direct coupling method - 2002 IEC 61967-4:2002 Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions; 1
/150 direct coupling method
