GJB 5491.13-2005
Test method of terminally guided projectile Part 13:Low-temperature storage and operating test (English Version)

Standard No.

GJB 5491.13-2005

Language

Chinese, Available in English version

Release Date

2005

Published By

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence

Latest

GJB 5491.13-2005

Scope

This part specifies the low-temperature storage and working test methods for terminally guided projectile projectiles (referred to as guided projectiles). This section applies to low-temperature storage and working tests of guided projectiles.

GJB 5491.13-2005 Referenced Document

• GJB 5491.1-2005 Test method of terminally guided projectile Part 1:General
• GJB 5491.2-2005 Test method of terminally guided projectile Part 2:Appearance check
• GJB 5491.7-2005 Test method of terminally guided projectile Part 7:Circuit resistance detection test and measurement
• GJB 5491.8-2005 Test method of terminally guided projectile Part 8:Maximum consuming current inspection test and measurement
• GJB 5491.9-2005 Test method of terminally guided projectile Part 9:Funcion test and measurement

GJB 5491.13-2005 history

• 2005 GJB 5491.13-2005 Test method of terminally guided projectile Part 13:Low-temperature storage and operating test