IEEE 1450.6-2005
IEEE Standard Test Interface Language (STIL) for Digital Test Vector DataCore Test Language (CTL)

Standard No.

IEEE 1450.6-2005

Release Date

2005

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Latest

IEEE 1450.6-2005

Scope

Develops a language that will provide a sufficient description of a core to support reuse of test data developed for that core after integration into SoC [Systems on Chip] environments, and to enable the creation of test patterns for the logic in the SoC external to the core.

IEEE 1450.6-2005 history

• 2005 IEEE 1450.6-2005 IEEE Standard Test Interface Language (STIL) for Digital Test Vector DataCore Test Language (CTL)