IEC 61788-3:2006 PDF

Scope: This part of IEC 61788 covers a test method for the determination of the dc critical current of short and straight Ag- and/or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors that have a monolithic structure and a shape of round wire or flat or square tape containing mono- or multicores of oxides. This method is intended for use with superconductors that have critical currents less than 500 A and n-values larger than 5. The test is carried out with and without an applying external magnetic field. For all tests in a magnetic field, the magnetic field is perpendicular to the length of the specimen. In the test of a tape specimen in a magnetic field, the magnetic field is parallel or perpendicular to the wider tape surface (or one surface if square). The test specimen is immersed either in a liquid helium bath or a liquid nitrogen bath during testing. Deviations from this test method that are allowed for routine tests and other specific restrictions are given in this standard.

IEC 61788-3:2006 Referenced Document

IEC 60050-815:2000 International Electrotechnical Vocabulary - Part 815: Supraconductivity

2006 IEC 61788-3:2006 Superconductivity - Part 3: Critical current measurement - DC critical current of Ag- and/or Ag alloy-sheathed Bi-2212 and Bi-2223 oxide superconductors
2000 IEC 61788-3:2000 Superconductivity - Part 3: Critical current measurement; DC critical current of Ag-sheathed Bi-2212 and Bi-2223 oxide superconductors