JIS C 61000-4-20:2006
Electromagnetic compatibility (EMC) -- Part 4-20: Testing and measurement techniques -- Emission and immunity testing in transverse electromagnetic (TEM) waveguides

Standard No.

JIS C 61000-4-20:2006

Release Date

2006

Published By

Japanese Industrial Standards Committee (JISC)

Status

Withdraw

Replace By

JIS C 61000-4-20:2014

Latest

JIS C 61000-4-20:2014

JIS C 61000-4-20:2006 history

• 2014 JIS C 61000-4-20:2014 Electromagnetic compatibility (EMC) -- Part 4-20: Testing and measurement techniques -- Emission and immunity testing in transverse electromagnetic (TEM) waveguides
• 2006 JIS C 61000-4-20:2006 Electromagnetic compatibility (EMC) -- Part 4-20: Testing and measurement techniques -- Emission and immunity testing in transverse electromagnetic (TEM) waveguides