Describes the use of an optical time-domain reflectometer (OTDR) to measure the loss and reflectance of a splice or connector indirectly. This standard was first listed for public review in the March 15, 1996 and November 7, 1997 issues of Standards Action. It is being resubmitted due to substantive changes to the text.
ANSI/TIA/EIA 455-8-2000 history
2000ANSI/TIA/EIA 455-8-2000 Measurement of Splice or Connector Loss and Reflectance Using an OTDR