ANSI/TIA/EIA 526-19-2000
Optical Signal-to-Noise Ratio Measurement Procedures for Dense Wavelength-Division Multiplexed Systems

Standard No.
ANSI/TIA/EIA 526-19-2000
Release Date
2000
Published By
American National Standards Institute （ANSI)
Latest
ANSI/TIA/EIA 526-19-2000
Scope
Provides a parameter definition and a test method for obtaining optical signal-to-noise (OSNR) using apparatus that measures the optical spectrum at a multi-channel interface.

ANSI/TIA/EIA 526-19-2000 history

  • 2000 ANSI/TIA/EIA 526-19-2000 Optical Signal-to-Noise Ratio Measurement Procedures for Dense Wavelength-Division Multiplexed Systems

ANSI/TIA/EIA 526-19-2000 -All Parts

ANSI/TIA/EIA 526-10-1993 Measurement of Dispersion Power Penalty in Digital Single-Mode Systems ANSI/TIA/EIA 526-11-1991 Measurement of Single-Reflection Power Penalty for Fiber Optic Terminal Equipment ANSI/TIA/EIA 526-15-1993 Jitter Tolerance Measurement ANSI/TIA/EIA 526-16-1993 Jitter Transfer Function Measurement ANSI/TIA/EIA 526-17-1993 Output Jitter Measurement ANSI/TIA/EIA 526-18-1993 Systematic Jitter Generation Measurement ANSI/TIA/EIA 526-7-1998 Measurement of Optical Power Loss of Installed Single-Mode Fiber Cable Plant ANSI/TIA/EIA 526-27-1998 Procedure for System-Level Temperature Cycle Endurance Test ANSI/TIA/EIA 526-4A-1997 Optical Eye Pattern Measurement Procedure ANSI/TIA/EIA 526-7-1998 Measurement of Optical Power Loss of Installed Single-Mode Fiber Cable Plant


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