ANSI/IEEE 300:1988
Test Procedures for Semiconductor Charged-Particle Detectors

Standard No.

ANSI/IEEE 300:1988

Release Date

1988

Published By

American National Standards Institute （ANSI)

Latest

ANSI/IEEE 300:1988

Scope

This standard applies to semiconductor radiation detectors that are used for the detection of high-resolution spectroscopy of charged particles.

ANSI/IEEE 300:1988 history

• 1988 ANSI/IEEE 300:1988 Test Procedures for Semiconductor Charged-Particle Detectors