IEC PAS 62206:2000 Power and temperature cycling was changed to IEC 60749-34:2005 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling.
IEC PAS 62206:2000 Power and temperature cycling was changed to IEC 60749-34:2004 Semiconductor devices - Mechanical and climatic test methods - Part 34: Power cycling.
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