IEC PAS 62177:2000
Highly-accelerated temperature and humidity stress test (HAST)

Standard No.

IEC PAS 62177:2000

Release Date

2000

Published By

International Electrotechnical Commission (IEC)

Status

Withdraw

Latest

IEC PAS 62177:2000

Replace By

IEC 60749-4:2002

IEC PAS 62177:2000 history

• 2000 IEC PAS 62177:2000 Highly-accelerated temperature and humidity stress test (HAST)

IEC PAS 62177:2000 Highly-accelerated temperature and humidity stress test (HAST) was changed to IEC 60749-4:2002 Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST).