IEC PAS 62191:2000
Acoustic microscopy for nonhermetic encapsulated electronic components

Standard No.

IEC PAS 62191:2000

Release Date

2000

Published By

International Electrotechnical Commission (IEC)

Status

Withdraw 2002-03

Latest

IEC PAS 62191:2000

Replace By

IEC 60749-35:2006

IEC PAS 62191:2000 history

• 2000 IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components

IEC PAS 62191:2000 Acoustic microscopy for nonhermetic encapsulated electronic components was changed to IEC 60749-35:2006 Semiconductor devices - Mechanical and climatic test methods - Part 35: Acoustic microscopy for plastic encapsulated electronic components.