IEC 61000-4-29:2000
Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques; Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests

Standard No.

IEC 61000-4-29:2000

Release Date

2000

Published By

International Electrotechnical Commission (IEC)

Latest

IEC 61000-4-29:2000

Replace

IEC 77A/250/CDV:1998 IEC 77A/307/FDIS:2000

Scope

This part of IEC 61000 defines test methods for immunity to voltage dips, short interruptions and voltage variations at the d.c. input power port of electrical or electronic equipment. This standard is applicable to low voltage d.c. power ports of equipment supplied by external d.c. networks. The object of this standard is to establish a common and reproducible basis for testing electrical and electronic equipment when subjected to voltage dips, short interruptions or voltage variations on d.c. input power ports. This standard defines: - the range of test levels; - the test generator; - the test set-up; - the test procedure. The test described hereinafter applies to electrical and electronic equipment and systems. It also applies to modules or subsystems whenever the EUT (equipment under test) rated power is greater than the test generator capacity specified in clause 6. The ripple at the d.c. input power port is not included in the scope of this part of IEC 61000. It is covered by IEC 61000-4-17 This standard does not specify the tests to be applied to particular apparatus or systems. Its main aim is to give a general basic reference to IEC product committees. These product committees (or users and manufacturers of equipment) remain responsible for the appropriate choice of the tests and the severity level to be applied to their equipment. note:1) IEC 61000-4-17, Electromagnetic compatibility (EMC) - Part 4-17: Testing and measurement techniques -Ripple on d.c. input power port immunity test

IEC 61000-4-29:2000 history

• 2000 IEC 61000-4-29:2000 Electromagnetic compatibility (EMC) - Part 4-29: Testing and measurement techniques; Voltage dips, short interruptions and voltage variations on d.c. input power port immunity tests