JIS K 0142:2000
Surface chemical analysis -- Information formats

Standard No.
JIS K 0142:2000
Release Date
2000
Published By
Japanese Industrial Standards Committee (JISC)
Latest
JIS K 0142:2000
Scope
This standard specifies a format to supplement JIS K 0141: Surface chemical analysis - data transfer format, and is used to transmit data for the construction, enhancement, and modification of surface chemical analysis spectral databases. It is. The format applies to Auger Electron Spectroscopy (AES) and X-ray Photoelectron Spectroscopy (XPS).

JIS K 0142:2000 history




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