This standard specifies the format for transferring data between computers by direct wire, telephone line, local area network, or other communication means using parallel or serial interface methods. The transferred data is rewritten into characters that can be displayed on a normal display or printer. This format supports AES (Auger electron spectroscopy), EDX (energy dispersive X-ray spectroscopy), FABMS (fast atom bombardment mass spectrometry), ISS (ion scattering spectroscopy), SIMS (secondary ion mass spectrometry). , Compatible with SNMS (sputtered neutral particle mass spectrometry), UPS (ultraviolet photoelectron spectroscopy), XPS (X-ray photoelectron spectroscopy), XRF (X-ray fluorescence spectroscopy) and other similar analysis methods. This format also handles data processing obtained from spectra, elemental maps, depth profiles, and combinations of these generated by various experiments.
JIS K 0141:2000 history
2000JIS K 0141:2000 Surface chemical analysis -- Data transfer format