IEEE 1450-1999
Standard Interface Test Language (STIL) for Digital Test Vectors IEEE Computer Society
- Standard No.
- IEEE 1450-1999
- Release Date
- 1999
- Published By
- Institute of Electrical and Electronics Engineers (IEEE)
- Status
- Replace By
- IEEE 1450-2007
- Latest
- IEEE 1450-2007
- Scope
- This project is to define a standard language that a) facilitates the transfer of large volumes of digital test information from computer Aided-Engineering (CAE) environments to Automated Test Equipment (ATE) environments; b) specifies pattern, format, and timing information sufficient to define the application of test vectors to a Device Under Test (DUT); c) supports the large bulk test information generated from structured test and integral test techniques for very large scale and ultra large scale integrated circuit designs in a format optimized for transportation and application in Automated Test Equipment (ATE) environments; d) supports device testing for integrated circuit, very large scale and ultra large scale integrated circuit test environments, but not restricted from application to other digital test environments.
IEEE 1450-1999 history
- 2007 IEEE 1450-2007 Standard Test Interface Language (STIL) for Digital Test Vector Data (IEEE Computer Society)
- 1999 IEEE 1450-1999 Standard Interface Test Language (STIL) for Digital Test Vectors IEEE Computer Society
