- Standard No.
- BS IEC 60748-11:2000
- Release Date
- 1991
- Published By
- British Standards Institution (BSI)
- Latest
-
BS IEC 60748-11:2000
- Replace
-
88/28415 DC:1988
BS 9450:1998
- Scope
- Quality assessment procedures, inspection requirements, screening sequences, sampling requirements, test and measurement procedures for encapsulated, including multichip circuits. To be read in conjunction with BS QC 700000
BS IEC 60748-11:2000 history
- 1991 BS IEC 60748-11:2000 Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits
- 1998 BS 9450:1998 Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures). Generic data and methods of test
- 1991 BS IEC 60748-11:1991 Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits
- 1975 BS 9450:1975 Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures): generic data and methods of test
BS IEC 60748-11:2000 Semiconductor devices - Integrated circuits - Sectional specification for semiconductor integrated circuits excluding hybrid circuits has been changed from BS 9450:1998 Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures). Generic data and methods of test.