JIS Z 9010:1999
Sequential sampling plans for inspection by variables for percent nonconforming (known standard deviation)

Standard No.

JIS Z 9010:1999

Release Date

1999

Published By

Japanese Industrial Standards Committee (JISC)

Latest

JIS Z 9010:1999

Scope

This International Standard specifies sequential sampling methods and sampling procedures for the metrological testing of discrete (countable) items. This standard complements JIS Z 9009. The sampling method in this standard uses producer risk points and consumer risk points as indicators.

JIS Z 9010:1999 history

• 1999 JIS Z 9010:1999 Sequential sampling plans for inspection by variables for percent nonconforming (known standard deviation)
• 1979 JIS Z 9010:1979 Sequential sampling inspection plans for percent defectives having desired operating characteristics by variables (standard deviation known)