DIN 50456-3:1999
Testing of materials for semiconductor technology - Method for the characterisation of moulding compounds for electronic components - Part 3: Determination of cationic impurities

Standard No.

DIN 50456-3:1999

Release Date

1999

Published By

German Institute for Standardization

Latest

DIN 50456-3:1999

Scope

The document defines a method for the determination of Na, K and CA in moulding compounds for electronic components by analysis of an aqueous extract of the epoxy resin moulding compound by means of the pressure cooker test according to DIN 50456-2.#,,#

DIN 50456-3:1999 history

• 1999 DIN 50456-3:1999 Testing of materials for semiconductor technology - Method for the characterisation of moulding compounds for electronic components - Part 3: Determination of cationic impurities