JIS R 1637:1998
Test method for resistivity of conductive fine ceramic thin films with a four-point probe array

Standard No.

JIS R 1637:1998

Release Date

1998

Published By

Japanese Industrial Standards Committee (JISC)

Latest

JIS R 1637:1998

Scope

This standard specifies the method for testing the resistivity of fine ceramic thin films using the four-probe method.

JIS R 1637:1998 history

• 1998 JIS R 1637:1998 Test method for resistivity of conductive fine ceramic thin films with a four-point probe array