DIN EN 60444-2:1997
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980); German version EN 60444-2:1997

Standard No.

DIN EN 60444-2:1997

Release Date

1997

Published By

German Institute for Standardization

Status

Be replaced

Replace By

DIN EN 60444-2:1997-10

Latest

DIN EN 60444-2:1997-10

Replace

DIN IEC 60444-2:1992

DIN EN 60444-2:1997 history

• 1997 DIN EN 60444-2:1997-10 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980); German version EN 60444-2:1997
• 1997 DIN EN 60444-2:1997 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980); German version EN 60444-2:1997
• 0000 DIN IEC 60444-2:1992