IEC 62007-2:1997
Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods

Standard No.

IEC 62007-2:1997

Release Date

1997

Published By

International Electrotechnical Commission (IEC)

Status

Withdraw

Replace By

IEC 62007-2:1997/AMD1:1998

Latest

IEC 62007-2:2009

Replace

IEC 86/113/FDIS:1997 IEC 60747-5:1992 IEC 60747-5 AMD 1:1994

Scope

This part of IEC 62007 describes the measuring methods applicable to the semiconductor optoelectronic devices to be used in the field of fibre optic systems and subsystems.

IEC 62007-2:1997 history

• 2009 IEC 62007-2:2009 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
• 1999 IEC 62007-2:1999 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
• 1970 IEC 62007-2:1997/AMD1:1998 Amendment 1 - Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods
• 1997 IEC 62007-2:1997 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods

IEC 62007-2:1997 Semiconductor optoelectronic devices for fibre optic system applications - Part 2: Measuring methods has been changed from IEC 60747-5:1992 Semiconductor devices; discrete devices and integrated circuits; part 5: optoelectronic devices.