DIN 50449-2:1998
Testing of materials for semiconductor technology - Determination of impurity content in semiconductors by infrared absorption - Part 2: Boron in gallium arsenide

Standard No.
DIN 50449-2:1998
Release Date
1998
Published By
German Institute for Standardization
Status
Latest
DIN 50449-2:1998
Scope
The method specified in this document covers the determination of the boron content in gallium arsenide by infrared absorption. It is used for semiisolating single-crystal gallium arsenide with a resistivity greater than 10 cm<(hoch)>6.

DIN 50449-2:1998 history

  • 1998 DIN 50449-2:1998 Testing of materials for semiconductor technology - Determination of impurity content in semiconductors by infrared absorption - Part 2: Boron in gallium arsenide
Testing of materials for semiconductor technology - Determination of impurity content in semiconductors by infrared absorption - Part 2: Boron in gallium arsenide



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