GB/T 16894-1997 (English Version) PDF

Standard No.: GB/T 16894-1997
Language: Chinese, Available in English version
Release Date: 1997
Published By: General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China
Latest: GB/T 16894-1997

Scope: The International Electrotechnical Commission electronic device quality assessment system follows the charter of the International Electrotechnical Commission and works under the authorization of the International Electrotechnical Commission. The purpose of the assessment system is to define the quality assessment procedure in such a way that an electronic device released by one Member State as complying with the applicable scope requirements is also acceptable in other Member States without further testing. This blank detail specification is one of the semiconductor device-series blank detail specifications and should be used together with the following specifications of the International Electrotechnical Commission. IEC747-10/QC700000 (1991) Part 10 of Semiconductor Devices: General Specifications for Discrete Devices and Integrated Circuits IEC747-11/QC750100 (1985) Part 11 of Semiconductor Devices: Sub-Specifications for Discrete Devices. required information

GB/T 16894-1997 history

1997 GB/T 16894-1997 Blank detail specification for rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100A