IEC 61649:1997
Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data

Standard No.
IEC 61649:1997
Release Date
1997
Published By
International Electrotechnical Commission (IEC)
Status
 2008-08
Replace By
IEC 61649:2008
Latest
IEC 61649:2008
Scope
This International Standard provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence intervals for the parameters of the two-parameter Weibull distribution when these are estimated by maximum likelihood. In addition, it provides a recommended procedure to obtain lower confidence limits for the 10 % fractiles of the lifetime and for the reliability function. This standard is applicable whenever a random sample of items is subjected to a test of times to failure for the purpose of estimating measures of reliability performance of the population from which these items were drawn.

IEC 61649:1997 history

  • 2008 IEC 61649:2008 Weibull analysis
  • 1997 IEC 61649:1997 Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data



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