JIS K 0131:1996
General rules for X-ray diffractometric analysis

Standard No.

JIS K 0131:1996

Release Date

1996

Published By

Japanese Industrial Standards Committee (JISC)

Latest

JIS K 0131:1996

Scope

This standard stipulates general matters when using an X-ray diffraction device to measure diffracted X-rays to identify and quantify substances, precisely measure lattice constants, and measure crystallinity.

JIS K 0131:1996 history

• 1996 JIS K 0131:1996 General rules for X-ray diffractometric analysis