JIS H 0604:1995
Measuring of minority-carrier lifetime in silicon single crystal by photoconductive decay method

Standard No.

JIS H 0604:1995

Release Date

1995

Published By

Japanese Industrial Standards Committee (JISC)

Latest

JIS H 0604:1995

Scope

This standard specifies a method for measuring the pulse reviscosity lifetime (hereinafter referred to as "pulk lifetime" or τB) of minority carriers in a silicon single crystal using the photoconductive decay method using a DC circuit. The single crystal to be measured must have a uniform composition and a resistivity of lΩ·cm or more.

JIS H 0604:1995 history

• 1995 JIS H 0604:1995 Measuring of minority-carrier lifetime in silicon single crystal by photoconductive decay method