DIN ISO 7503-1:1990
Evaluation of surface contamination; beta-emitters (maximum beta energy greater than 0,15 MeV) and alpha-emitters; identical with ISO 7503-1:1988
- Standard No.
- DIN ISO 7503-1:1990
- Release Date
- 1990
- Published By
- German Institute for Standardization
- Status
- 2017-12
- Replace By
- DIN ISO 7503-1:2017
- DIN ISO 7503-2:2017
- DIN ISO 7503-3:2017
- Latest
- DIN ISO 7503-1:2017
- DIN ISO 7503-2:2017
- DIN ISO 7503-3:2017
- Scope
- This standard applies to the evaluation of contamination of surfaces of equipment and facilities, containers of radioactive materials and seled sources in terms of activity per unit area. It applies to beta-emitters the maximum beta-energy of which is greater than 0,15 MeV and alpha-emitters. It is restricted to beta- and alpha-emitters the production rate of which with regard to beta-perticled plus mono-energetic electrons and alpha-particles respectively is near to 100 particles per 100 decays. This standard does not apply to the evaluation of contamination of the skin and of clothing.
DIN ISO 7503-1:1990 history
- 2017 DIN ISO 7503-1:2017 Measurement of radioactivity - Measurement and evaluation of surface contamination - Part 1: General principles (ISO 7503-1:2016)
- 1990 DIN ISO 7503-1:1990 Evaluation of surface contamination; beta-emitters (maximum beta energy greater than 0,15 MeV) and alpha-emitters; identical with ISO 7503-1:1988
DIN ISO 7503-1:1990 Evaluation of surface contamination; beta-emitters (maximum beta energy greater than 0,15 MeV) and alpha-emitters; identical with ISO 7503-1:1988 was changed to DIN ISO 7503-3:2017 Measurement of radioactivity - Measurement and evaluation of surface contamination - Part 3: Apparatus calibration (ISO 7503-3:2016).
DIN ISO 7503-1:1990 Evaluation of surface contamination; beta-emitters (maximum beta energy greater than 0,15 MeV) and alpha-emitters; identical with ISO 7503-1:1988 was changed to DIN ISO 7503-2:2017 Measurement of radioactivity - Measurement and evaluation of surface contamination - Part 2: Test method using wipe-test samples (ISO 7503-2:2016).
