IEC 60068-2-29:1987
Basic environmental testing procedures. Part 2 : Tests. Test Eb and guidance: Bump
- Standard No.
- IEC 60068-2-29:1987
- Release Date
- 1987
- Published By
- International Electrotechnical Commission (IEC)
- Status
- 2008-02
- Latest
- IEC 60068-2-29:1987
- Replace By
- IEC 60068-2-27:2008
- Scope
- Is applicable to components, equipment and other electrotechnical products, which, during transportation or in use, may be subjected to repetitive shocks. Provides a standard procedure for determining the ability of a specimen to withstand specified seve
IEC 60068-2-29:1987 history
- 1987 IEC 60068-2-29:1987 Basic environmental testing procedures. Part 2 : Tests. Test Eb and guidance: Bump
- 1970 IEC 60068-2-29:1968/AMD2:1983 Amendment 2 - Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test Eb: Bump
- 1970 IEC 60068-2-29:1968/AMD1:1982 amendment 1 - Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test Eb: Bump
- 1970 IEC 60068-2-29:1968 Basic environmental testing procedures for electronic components and electronic equipment - Part 2: Tests - Test Eb: Bump
