IEC 60747-11:1985
Semiconductor devices. Discrete devices. Part 11 : Sectional Specification for discrete devices

Standard No.

IEC 60747-11:1985

Release Date

1985

Published By

International Electrotechnical Commission (IEC)

Status

Be replaced

Replace By

IEC 60747-11:1985/AMD1:1991

Latest

IEC 60747-11:1985/AMD2:1996

Scope

Applicable to quality assessment for discrete semiconductor devices. Gives specific requirements for quality conformance inspection (included in QC 750000 of the IECQ system) and identification of terminals; represents the sectional specification. Contai

IEC 60747-11:1985 history

• 1996 IEC 60747-11:1985/AMD2:1996 Amendment 2 - Semiconductor devices. Discrete devices. Part 11: Sectional specification for discrete devices
• 1991 IEC 60747-11:1985/AMD1:1991 Semiconductor devices; part 11: sectional specification for discrete devices; amendment 1
• 1985 IEC 60747-11:1985 Semiconductor devices. Discrete devices. Part 11 : Sectional Specification for discrete devices