The standard describes procedures for the assessment of dielectric pastes to be used in integrated film circuits. Thereby the suitability is to diffentiate for the three main applications cross-over, dielectric and protective coating. The tests, necessary for this assessment, are carried out by means of a test substrat the layout of which is laid down in this standard.#,,#
DIN 41850-3:1985 history
1985DIN 41850-3:1985 Integrated film circuits; methods for the assessment of dielectric pastes