DIN EN 60749-38:2008-10
Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008

Standard No.

DIN EN 60749-38:2008-10

Release Date

2008

Published By

German Institute for Standardization

Latest

DIN EN 60749-38:2008-10

DIN EN 60749-38:2008-10 history

• 2008 DIN EN 60749-38:2008-10 Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008
• 2008 DIN EN 60749-38:2008 Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory (IEC 60749-38:2008); German version EN 60749-38:2008