ANSI/IEEE Std 300-1982
IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors

Standard No.

ANSI/IEEE Std 300-1982

Release Date

1992

Published By

Institute of Electrical and Electronics Engineers (IEEE)

Latest

ANSI/IEEE Std 300-1982

Scope

The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. These detectors are in wide-spread use for the detection and high resolution spectroscopy of charged particles. It is desirable to maintain standard test procedures so that measurements may have the same meaning to all manufacturers and users. Not all tests described in this standard ...

ANSI/IEEE Std 300-1982 history

• 1992 ANSI/IEEE Std 300-1982 IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors