UNE-EN 62415:2010
Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)

Standard No.

UNE-EN 62415:2010

Release Date

2010

Published By

ES-UNE

Latest

UNE-EN 62415:2010

UNE-EN 62415:2010 history

• 2010 UNE-EN 62415:2010 Semiconductor devices - Constant current electromigration test (Endorsed by AENOR in September of 2010.)