EN 62415:2010
Semiconductor devices - Constant current electromigration test

Standard No.

EN 62415:2010

Release Date

2010

Published By

CENELEC - European Committee for Electrotechnical Standardization

Latest

EN 62415:2010

Scope

This standard describes a method for conventional constant current electromigration testing of metal lines@ via string and contacts.

EN 62415:2010 history

• 2010 EN 62415:2010 Semiconductor devices - Constant current electromigration test